The greatest advantage of secondary ion mass spectrometry is the high spatial decision. Unlike different strategies, ion-probe analyses have the power to carry out measurements from analytical volumes of 1 to 5 nanograms of material. As titanium cookware a outcomes, the sputtered pit geometry usually has a diameter of ~15 5o 25 microns, and a depth of ~2 microns.
The greatest advantage of secondary ion mass spectrometry is the high spatial decision. Unlike different strategies, ion-probe analyses have the power to carry out measurements from analytical volumes of 1 to 5 nanograms of material. As titanium cookware a outcomes, the sputtered pit geometry usually has a diameter of ~15 5o 25 microns, and a depth of ~2 microns.
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